Unlike almost every other kind of microscope, atomic-force microscopes (AFMs) don’t use any kind of optical beam to image ...

In this interview, Professor Emeritus Mervyn Miles at the University of Bristol speaks about the history and technology behind Atomic Force Microscopy (AFM) and Scanning Probe Microscopy (SPM). Can ...

Knowing interaction forces between nanostructures and their substrates is important in nanomanufacturing, such as template-directed assembly. A new mechanical membrane-based AFM (atomic force ...

This article introduces Park Systems' latest large-sample atomic force microscope (AFM), the FX200—engineered to support both foundational studies and advanced research applications. Designed for ...

Carbon nanotube (CNT) probes have emerged as a transformative advance in atomic force microscopy, combining sub-nanometre tip radii with exceptional mechanical resilience. Their high aspect ratio ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Request A Quote Download PDF Copy The Nexus system reliably ...

This article introduces the FX200, the latest large-sample Atomic Force Microscope (AFM) from Park Systems, developed to meet both fundamental and advanced research requirements. The FX200 is ...

Researchers at the Nano Life Science Institute (WPI-NanoLSI), Kanazawa University, report in ACS Applied Nano Materials a new method to precisely measure nuclear elasticity—the stiffness or softness ...

Username: Asylum User There is no password. Start the AFM Software by selecting the Asylum Research Icon. Select the profile to be used: AC Air Topography is tapping mode. Sign into the Log Book on ...

This panel will modify the raw image data. There is a Title Box just below the tabs that will have the name of the graph/image that will be modified. It is good to double check this if you have ...