Test engineers have a variety of options for testing printed-circuit boards—ranging from in-circuit testers to the latest in embedded-instrument technology. Despite the decline of PCB physical access ...
A few years ago, the semiconductor lingo for automated test equipment (ATE) PCBs was “load boards.” But more recently, they’ve become increasingly known in semiconductor parlance as “device interface ...
In-circuit test (ICT) systems have been the leaders in using electrical means to look for structural defects in PCBs. They employ bed-of-nails fixtures to provide electrical access to as many as 7000 ...
This article summarizes the content of a paper jointly developed and presented by Advantest and Infineon at TestConX 2022. Device under test (DUT) fixtures for ATE systems pose several verification ...
Far-field and radiating near-field are two options for high-volume over-the-air (OTA) testing of antenna-in-package (AiP) modules with automated test equipment (ATE) [1]. In this article, we define an ...
Simple mechanical changes can significantly improve probe card performance. Epoxy-ring probe cards with 2,000 or more probes are economical solutions to multi-DUT parallel test. The key to repeatable ...
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