Atomic Force Microscopy (AFM) is a type of high-resolution scanning probe microscopy that allows for imaging, manipulation, and force measurement. Atomic Force Microscopy was first developed in 1986 ...

An AFM is an instrument used for mapping the atomic-scale topography of a surface by utilizing the repulsive electronic forces between the surface and the tip of a microscope probe as it moves above ...

This article serves as a basic introduction to the design and operation of an atomic force microscope. The following sections cover the basic concepts and technologies that help understand the ...

The Atomic Force Microscope (AFM) has evolved from an extremely high resolution scientific research instrument into a highly accurate metrology tool. This evolution has broadened the role of the AFM ...

Scientists have discovered a new method to manipulate atoms. Using the atoms at the tip (that are chemically different to those at the surface) as “ink”, it is possible to “write” or “draw” with the ...

Topgraphy and frequency shift images of the ITP radical in constant-current mode. Courtesy : D Ebeling Ten years ago, researchers succeeded in significantly increasing the lateral resolution of low ...

A further development in atomic force microscopy now makes it possible to simultaneously image the height profile of nanometer-fine structures as well as the electric current and the frictional force ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

To the surprise of chemists, a new technique for taking snapshots of molecules with atomic precision is turning up chemicals they shouldn't be able to see. Chemical reactions take place so rapidly - ...

Doing it yourself may not get you the most precise lab equipment in the world, but it gets you a hands-on appreciation of the techniques that just can’t be beat. Today’s example of this adage: [Stoppi ...