Santa Clara, Calif.—Agilent Technologies Inc. has expanded its Universal Serial Bus (USB) test portfolio with what it is calling the industry's first automated calibration of a USB 3.0 pattern ...

Understand why testing must evolve beyond deterministic checks to assess fairness, accountability, resilience and ...

Avoid these mistakes to build automation that survives UI changes, validates outcomes properly, and provides useful feedback.

To keep up with time-to-market demands when SoCs keep increasing in size and complexity requires the adoption of better DFT flows and technologies. One of the most successful changes in ...

Most testing strategies collapse under the weight of modern software development demands. But speed requirements continue to increase while application complexity grows, which creates an impossible ...

As semiconductor devices advance in complexity and sensitivity to power fluctuations, the integration of power-aware automatic test pattern generation (ATPG) is becoming indispensable for yield and ...

[Nicholas Murray]’s Composite Test Pattern Generator is a beautifully-made, palm-sized tool that uses an ESP32-based development board to output different test patterns in PAL/NTSC. If one is checking ...

Nicholas Murray]’s Composite Test Pattern Generator is a beautifully-made, palm-sized tool that uses an ESP32-based development board to output different test patterns in PAL/NTSC. If one ...

AI-powered tooling has been around for quite some time. You may even be using AI-based services without even realizing it. However, they had been mostly a part of a backend and were effective only for ...