Historically, testability is an afterthought in the design process. But heightening complexity of chip designs, and especially SoCs, forces testability (and manufacturability) to take a more central ...

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.

To view a PDF version of this article, click here. To maintain test quality, designers must continually update or replace their DFT techniques. While this applies across the board, DFT for ...