Today’s high power semiconductor test applications are increasingly demanding, requiring test instrumentation capable of characterizing higher rated voltages and peak currents than ever before. Many ...

Test and programming fixtures are great time-savers for anyone who needs to deal with more than a handful of PCBs. Instead of plugging in connectors (or awkwardly holding probe tips or wires) to ...

Wireless fixtures for in-circuit testing (ICT) have been available for more than 15 years and have no equal in testing high node-count complex circuit boards. However, there are other hidden ...

Testing of battery cells is frequently performed on fairly large groups of cells at the same time. Before testing can begin, the cells must be properly connected to the test equipment. For cells in a ...

I noted in a 2005 column (see "Current compression test methods" under “Editor's Pick,” at top right) that there are three basic methods of loading a composite material test specimen in compression: ...

This article summarizes the content of a paper jointly developed and presented by Advantest and Infineon at TestConX 2022. Device under test (DUT) fixtures for ATE systems pose several verification ...