Semiconductor Engineering

Using High-Quality Deterministic Patterns For In-System/In-Field Testing

Logic BIST (LBIST) is a well-stablished traditional solution for meeting automotive testing standards. However, using pseudo-random LBIST patterns can be challenging when trying to achieve ...
Semiconductor Engineering

Squeezing Out More Test Compression

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...
EDN

New approach moves logic BIST into mainstream

Logic BIST (LBIST) technology has been in use for decades. However, it did not enter the mainstream until recently. This article explores the traditional LBIST “Stumps” architecture and examines a new ...
Electronic Design

New test points help contain growing test costs

Recent and continuing trends in the semiconductor industry pose challenges to IC test-data volumes, test application times, and test costs. The industry has thus far succeeded in containing test costs ...
Electronic Design

Combining Logic BIST and Scan Test Compression

Small geometries have projected IC technology into an era where test has become a crucial part in the chip design process and have introduced new challenges needing solutions that use already ...
EDN

BER test method uses real data

Today's methods for BER (bit-error-rate) testing of high-speed serial links such as PCIe and SATA rely on predetermined patterns that don't represent real-world situations. These patterns use a ...