Researchers have designed a robust image-based anomaly detection (AD) framework with illumination enhancement and noise suppression features that can enhance the detection of subtle defects in ...

The team developed an off-axis bright- and dark-field OCT system with a custom-designed high-precision objective lens. By ...

A new research review looks at how computer vision and machine learning could be used to spot defects in 3D printed concrete.

WEST LAFAYETTE, Ind. — A defect in a semiconductor chip may be smaller than a human hair but can create big problems in your everyday life, from crippling your car’s steering to making your laptop ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

As the semiconductor world excitingly explores the potential of new advanced package solutions for their intricate and novel designs, challenges arise from undetected defects caused by the complexity ...

Within the context of semiconductor inspection and failure analysis, latent defects present a significant challenge because they make it difficult to determine whether a fault originated during ...