Test compression sounds like magic. Read on to learn how this trick is done. Large, complex ICs are viable because their design meets test as well as functional requirements. Design for test (DFT) was ...

With every passing day the Mule provides opportunities beyond our original expectations. Since the 467ci engine belongs to HPP editor Tom DeMauro, it is at our beck and call. This affords HPP the ...

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...

Design automation is the key to the development of very large ICs. Optimizing the connection and layout of millions of gates to efficiently perform complex functions is not a job to which humans are ...

We live in an era where the demand for portable and wearable devices have been increasing multifold. Products based on applications like IoT (Internet of Things), Artificial Intelligence, Virtual ...

I noted in a 2005 column (see "Current compression test methods" under “Editor's Pick,” at top right) that there are three basic methods of loading a composite material test specimen in compression: ...