Nasdaq

Aehr to Showcase FOX-P™ Wafer-Level, Die and Module Test Solutions at Virtual SWTest Untethered 2020 Conference on November 11

FREMONT, Calif., Nov. 09, 2020 (GLOBE NEWSWIRE) -- Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and reliability qualification equipment, will be showcasing its FOX-P™ ...
Nasdaq

Aehr Announces New Advanced Testing Capabilities on its FOX-P™ Wafer Level Test & Burn-in Systems for Silicon Carbide and Gallium Nitride Technologies

FREMONT, Calif., Oct. 06, 2022 (GLOBE NEWSWIRE) -- Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and reliability qualification equipment, today announced it has released ...
Digi Times

STAr Technologies releases new test software for advanced wafer-level reliability qualification

STAr Technologies, a provider of semiconductor test solutions, releases a new Sagittarius-WLR integrated platform for advanced Wafer-Level Reliability (WLR) tests. Sagittarius-WLR is developed to ...
Seeking Alpha

Aehr Test Systems Announces Wafer Level Burn-in and Test Application Evaluation Order from Leading AI Processor Supplier

FREMONT, CA / ACCESS Newswire / August 26, 2025 / Aehr Test Systems (AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received a purchase order from a ...
EDN

SUSS MicroTec installs wafer test system in Japan

SUSS MicroTec announces the installation of its PM300WLR 300-mm wafer-level reliability (WLR) test system at a leading Japanese manufacturer of semiconductor devices where it will be used to test the ...
EDN

Making ICs more reliable

Fairchild fellow Timwah Luk (left) and Jifa Hao, worldwide wafer-level reliability engineer, test ICs well beyond published limits. Photo by Jeff Stevensen. South Portland, ME—Whenyou manufacture more ...

Aehr Receives Follow-On Order for Fully Automated Wafer-Level Burn-In Systems Powering AI Optical I/O and Data Center Interconnects

Detailed price information for Aehr Test Systems (AEHR-Q) from The Globe and Mail including charting and trades.
Digi Times

STAr Technologies launches next generation all-in-one per-pin SMU reliability test system

STAr Technologies, a leader in parametric and reliability test systems today has launched STAr Pluto series tester to meet test needs for both Package- and Wafer-level reliability test systems. This ...
CNN

Aetrium Introduces New Wafer Level Reliability Test Platform

ST. PAUL, Minn., April 16, 2013 (GLOBE NEWSWIRE) -- Aetrium Incorporated (Nasdaq:ATRM) today introduced a new Wafer Level Reliability (WLR) test platform to its portfolio of reliability test products, ...

Aehr Receives $14 Million Order from Lead AI Processor Customer for Multiple New Fully Automated FOX-XP Wafer Level Burn-In Systems

Detailed price information for Aehr Test Systems (AEHR-Q) from The Globe and Mail including charting and trades.
CU Boulder News & Events

Alumnus awarded IEEE Fellow status for semiconductor testing innovations

Congratulations to alumnus Bryan Root (ElEngr’84), who was recently elevated to Institute of Electrical and Electronics Engineers Fellow for leadership in improving semiconductor reliability test ...
Semiconductor Engineering

Auto Chipmakers Dig Down To 10ppb

How do engineers deliver 10 defective parts per billion (Dppb) to auto makers if they only screen 1 million parts per year? Answer: By comprehending failure mechanisms and proactively screening for ...