Improving baseline yields and speeding yield learning are always issues in semiconductor manufacturing. Addressing those problems may have just gotten a little easier for defect and yield engineers ...

Such features can make defect tracking fun and less of a boring activity for developers. It will help developers in generating better bug reports, making the entire process of defect management easier ...

However, process- or tool- induced problems may arise during wafer fabrication that cause scratches and other spatial signatures on the wafer that will not be caught by statistical process control ...

HAWTHORNE, N.Y., July 17, 2020 /PRNewswire/ -- SEMICON West 2020 – Microtronic, maker of high-speed full-wafer macro defect inspection systems and software, has just announced an innovative new way to ...

BOSTON--(BUSINESS WIRE)--On June 14 2023, G2, the world's largest software marketplace, released its Summer reports. Kualitee, a complete test management tool, has gained 18 notable recognitions in ...