In traditional semiconductor packaging, manual defect review after automated optical inspection (AOI) is an arduous task for operators and engineers, involving review of both good and bad die. It is ...
Integrating deep learning in optical microscopy enhances image analysis, overcoming traditional limitations and improving classification and segmentation tasks.
Microsoft shipped ML.NET 3.0, enhancing deep learning and data processing scenarios in the company's machine language framework that lets devs create AI-infused apps completely within the .NET ...
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